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<title>Micromachined VO<formula><inf><roman>2</roman></inf></formula>-based uncooled IR bolometric detector arrays with integrated CMOS readout electronics</title>
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1996
Year
EngineeringMicromachined VoIntegrated CircuitsDetector PhysicsElectronic DevicesSurface SiliconInstrumentationIr Bolometric DetectorsRadiation ImagingHealth SciencesElectrical EngineeringRadiation DetectionPhysicsAccelerator Mass SpectrometryComputer EngineeringPixel Detector ArraysMicroelectronicsOptical SensorsInfrared SensorApplied PhysicsDetector Physic
Uncooled IR bolometric detectors fabricated using surface silicon micromachining are presented. The detector fabrication process employs a polyamide sacrificial layer, and a VO<SUB>2</SUB> thermistor layer exhibiting a thermal coefficient of resistance on the order of -3 percent/degrees C. Detector sizes are 100 micrometers X 100 micrometers and 50 micrometers X 50 micrometers , and 64 X 64 and 128 X 128 pixel arrays are fabricate. The detectors exhibit responsivities of up to 15 000 VW<SUP>-1</SUP>, normalized detectivities typically exceeding 10<SUP>8</SUP> cm Hz<SUP>1/2</SUP>W<SUP>-1</SUP>, and response times below 20 ms. Three integrated readout circuit designs for 64 X 64 and 128 X 128 pixel detector arrays, fabricated using a standard 1.5 micrometers CMOS process,a re described. These circuits include several test and detector nonuniformity correction features and can operate in either self scanning mode at a rate of 30 frames per second, or in the random access mode in which column and row addresses are input directly.