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Hysteretic bipolar resistive switching characteristics in TiO2/TiO2−x multilayer homojunctions
70
Citations
12
References
2009
Year
Materials ScienceTransition Metal ChalcogenidesElectrical EngineeringEngineeringNanoelectronicsOxide ElectronicsSurface ScienceApplied PhysicsMultilayer HomojunctionsSemiconductor MaterialTio2/tio2−x Multilayer HomojunctionsResistive Switching PhenomenonLayered MaterialTopological HeterostructuresElectrochemistryOxygen Rich
TiO 2 (oxygen rich, region 1)/TiO2−x (oxygen poor, region 2) multilayer homojunctions were studied as alternative resistive switching structures for both high and low resistance transitions. Stable bipolar resistive switching characteristics, including stable switching speeds (microseconds) and endurance behaviors, as well as long retention times (>104 s) were demonstrated. The nature of the resistive switching phenomenon in multilayer structures seems to be a combination of the conduction path and the redox reaction, resulting from the oxygen ions drifting between the oxygen rich and poor regions of the multilayer structures. A possible conduction sketch for bipolar switching behaviors is also discussed.
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