Applied Physics Letters · 2009 · 70 citations · 12 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsConductive MaterialsMemristive MaterialsMetal Oxide NanomaterialsOxide SemiconductorsRedox-active MaterialsSemiconductor Device MaterialsConductionElectronic ConductionEnduranceLow-resistance MechanismsOxide Memristive MaterialsRedox Reaction KineticsResistive SwitchingResistive Switching Materials
TiO 2 (oxygen rich, region 1)/TiO2−x (oxygen poor, region 2) multilayer homojunctions were studied as alternative resistive switching structures for both high and low resistance transitions. Stable bipolar resistive switching characteristics, including stable switching speeds (microseconds) and endurance behaviors, as well as long retention times (>104 s) were demonstrated. The nature of the resistive switching phenomenon in multilayer structures seems to be a combination of the conduction path and the redox reaction, resulting from the oxygen ions drifting between the oxygen rich and poor regions of the multilayer structures. A possible conduction sketch for bipolar switching behaviors is also discussed.
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