Evidence for Extensive Grain Boundary Meander and Overgrowth of Substrate Grain Boundaries in High Critical Current Density ex Situ YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7−<i>x</i></sub> Coated Conductors - Concepedia

Concepedia

Publication | Closed Access

Evidence for Extensive Grain Boundary Meander and Overgrowth of Substrate Grain Boundaries in High Critical Current Density ex Situ YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7−<i>x</i></sub> Coated Conductors

38

Citations

30

References

2005

Year

David Feldmann, D. C. Larbalestier, T. G. Holesinger, R. M. Feenstra, A. A. Gapud, E. D. Specht

Journal of materials research/Pratt's guide to venture capital sources

Materials ScienceSuperconducting MaterialSubstrate Grain BoundariesEngineeringHigh-tc SuperconductivityApplied PhysicsCondensed Matter PhysicsSuperconductivitySemiconductor MaterialEpitaxial Growth

References

	Year	Citations

Page 1