Method for measurement of lattice parameter of cubic GaN layers on GaAs (001) - Concepedia

Concepedia

Publication | Closed Access

Method for measurement of lattice parameter of cubic GaN layers on GaAs (001)

45

Citations

14

References

2003

Year

Xiantong Zheng, Y.T. Wang, Zhihong Feng, Hui Yang, Hongsong Chen, J. M. Zhou, Junwu Liang

Journal of Crystal Growth

Semiconductor TechnologyWide-bandgap SemiconductorElectrical EngineeringEngineeringApplied PhysicsGan Power DeviceLattice ParameterCubic Gan Layers

References

	Year	Citations

Page 1