Sensitivity in X-ray grating interferometry on compact systems

Abstract

The optimization of compact X-ray grating interferometry systems is crucial for the progress of this technique in industrial devices. Here, an analytical formulation for the sensitivity of the phase contrast image acquisition is derived using previous results from noise analyses. Furthermore, experimental measurements of the sensitivity for different configurations are compared, providing further insight into the dependence on polychromatic radiation. Finally, strategies for the geometrical optimization are given.