Heterojunction with ZnO polycrystalline thin films for optoelectronic devices applications

Abstract

Thin films of ZnO were deposited by thermal decomposition of Zn(C5H7O2)2 on semiconductor substrate, n-type silicon, p-type InP and also on transparent glass substrate. The obtained ZnO/Si and ZnO/InP heterostructures were investigated for optical properties by spectrophotometry and surface morphology by AFM. The measured values of optoelectrical parameters in the visible spectral range and the lateral photovoltage characteristics demonstrate the possibility of using ZnO/n-Si and ZnO/p-InP heterojunctions for photodetection and photovoltaic devices applications.