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Resonant and voltage-tunable terahertz detection in InGaAs∕InP nanometer transistors
210
Citations
11
References
2006
Year
Terahertz TechnologyEngineeringTerahertz PhotonicsTerahertz PhysicsTerahertz Material PropertiesNanoelectronicsElectronic EngineeringVoltage-tunable Terahertz DetectionElectrical EngineeringTerahertz SpectroscopyTerahertz ScienceHigh Electron MobilityIngaas∕alinas TransistorsTerahertz DevicesApplied PhysicsTerahertz TechniqueTerahertz RadiationOptoelectronicsTerahertz Applications
The study used InGaAs/AlInAs nanotransistors operated between 10 K and 80 K, interpreting observed resonances as plasma‑wave excitations in the gated two‑dimensional electron gas. The devices detected terahertz radiation up to 3.1 THz, exhibiting a gate‑tunable resonant photovoltaic response and a low noise‑equivalent power that suggests suitability for terahertz sensing.
The authors report on detection of terahertz radiation by high electron mobility nanometer InGaAs∕AlInAs transistors. The photovoltaic type of response was observed at the 1.8–3.1THz frequency range, which is far above the cutoff frequency of the transistors. The experiments were performed in the temperature range from 10to80K. The resonant response was observed and was found to be tunable by the gate voltage. The resonances were interpreted as plasma wave excitations in the gated two-dimensional electron gas. The minimum noise equivalent power was estimated, showing possible application of these transistors in sensing of terahertz radiation.
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