IEEE Transactions on Pattern Analysis and Machine Intelligence · 1994 · 30 citations · 19 references
ComputingComputer ScienceComputer VisionGeometryMachine VisionFeature DescriptionObject RecognitionParallel ProjectionShape AnalysisShape RepresentationFourier DescriptorsInvariant Feature DescriptorsShape Feature ExtractionShape RecognitionSymmetry DetectionSymmetry ExtractionSymmetry Transformations
In this paper, the method of elliptic Fourier descriptors using arc length parameterization is applied to tackle the problem of detection and recovery of symmetry under parallel projection. A simple and fast iteration algorithm together with the invariants of symmetry provides sufficient information for the detection and recovery of symmetry under parallel projection. The proposed method has been extensively tested using symmetric figures under different parallel projections. Simulation results of the algorithm are presented. The extension of this method for planar object recognition under parallel projection is also addressed.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Fourier Descriptors for Plane Closed Curves
C. T. Zahn, Ralph Roskies · IEEE Transactions on Computers · 1972 · 1.9K citations