Publication | Open Access
Transport of ions in a segmented linear Paul trap in printed-circuit-board technology
74
Citations
18
References
2008
Year
EngineeringIon Beam InstrumentationIntegrated CircuitsIon ProcessTransport PhenomenaIon BeamElectrode Segment WidthInstrumentationIon EmissionElectronic CircuitIon TrappingElectrical EngineeringAxial OscillationsPhysicsAtomic PhysicsPrinted-circuit-board TechnologyMicroelectronicsIon MobilityApplied Physics
We describe the construction and operation of a segmented linear Paul trap, fabricated in printed-circuit-board technology with an electrode segment width of 500 μm. We prove the applicability of this technology to reliable ion trapping and report the observation of Doppler-cooled ion crystals of 40Ca+ with this kind of trap. Measured trap frequencies agree with numerical simulations at the level of a few percent from which we infer a high fabrication accuracy of the segmented trap. To demonstrate its usefulness and versatility for trapped ion experiments we study the fast transport of a single ion. Our experimental results show a success rate of 99.0(1)% for a transport distance of 2×2 mm in a round-trip time of T = 20 μs, which corresponds to 4 axial oscillations only. We theoretically and experimentally investigate the excitation of oscillations caused by fast ion transports with error-function voltage ramps: for a slightly slower transport (a round-trip shuttle within T = 30 μs) we observe non-adiabatic motional excitation of 0.89(15) meV.
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