Beam scanning using microstrip line on biased ferrite

John C. Batchelor, R.J. Langley

Electronics Letters · 1997 · 36 citations · 3 references

Concepts

Abstract

The beam scanning properties of a 2-element patch array fed by a microstrip feed situated on a ferrite substrate are presented. Biasing the ferrite changes the phase length of the microstrip line, scanning the beam by up to 40°. The resulting scan loss is ~2 dB, mainly due to the ferrite becoming lossy as it approaches absorption resonance.

References

3