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Solid–solid phase transitions in <i>n</i>-alkanes C23H48 and C25H52: X-ray power diffraction study on new layer stacking in phase V
52
Citations
19
References
1995
Year
X-ray CrystallographyMaterials ScienceCrystal StructureNew Layer StackingEngineeringCrystalline DefectsPhase VNatural SciencesX-ray DiffractionCondensed Matter PhysicsApplied PhysicsSolid-state ChemistryChemistrySolid–solid Phase TransitionsCrystal FormationCrystallographyCrystal Structure Design
The solid–solid phase transitions and the crystal structures of odd n-alkanes, n-C23H48, and n-C25H52, were investigated by x-ray powder diffraction. The phase transitions, I→V→RI for n-C23H48 and I→V→IV→RI for n-C25H52, were observed, where phases I, V, IV are the low-temperature ordered phases, and the phase RI is the rotator phase. The crystal structure of phase V was determined by the Rietveld profile refinement method. Phase V is orthorhombic (Pbnm). New molecular layer stacking appears in phase V, while the lamellar structure and the lateral packing of molecules are same as those in phase I and phase IV. The solid–solid phase transitions below the rotator phase transition of odd n-alkanes found to be characterized by the changes in molecular layer stacking are considered to be caused by the increased disorder in the layer surface.
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