Characterization of a defect layer at a Schottky barrier interface by current and capacitance measurements - Concepedia

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Characterization of a defect layer at a Schottky barrier interface by current and capacitance measurements

21

Citations

16

References

1993

Year

A. Cola, Maria Grazia Lupo, L. Vasanelli, A. Valentini

Solid-State Electronics

Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringCapacitance MeasurementsApplied PhysicsElectronic PackagingDefect LayerMicroelectronicsElectrical InsulationSchottky Barrier Interface

References

	Year	Citations

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