2012 · 20 citations · 3 references
EngineeringElectrical EngineeringDigital ImagingOptoelectronicsSensors3D ImagingColor ImagingDigital Image ProcessingImage ProcessingImage SensorsPhotodetectors3D Image AcquisitionCmos Image SensorsColor SensorsDepth Map EstimationImage Sensor TechnologyPixel ArchitectureSingle-photon Avalanche DiodesTime-of-flight Image Sensors
Real-time capturing of a color image and depth map from an arbitrary scene is very crucial in various applications such as robotics, automotive, augmented reality, and interactive gaming, because it enables electronic devices to recognize and track target objects without complicated post-processing. Numerous color image sensors have been developed, pushing small-size and high-sensitivity pixels [1,2]; likewise, time-of-flight (ToF) depth imagers, where pixels directly provide their own depth information, have been presented based on single-photon avalanche diodes (SPADs) [3] and photo-mixing devices [4]. However, it is still challenging to implement a single image sensor that can simultaneously acquire color and depth images. This is because the principles of operation for acquisition of both types of images are totally different, resulting in a difference in detector devices and pixel sizes (1.4μm color vs. 40μm depth in commercial products). To address this problem, a CMOS image sensor with typical pinned-photodiode and multi-resolution functionality was recently demonstrated [5]. The paper shows that a conventional pinned-photodiode can demodulate a ToF signal at 10MHz frequency.
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Solid-state time-of-flight range camera
Robert Lange, Peter Seitz · IEEE Journal of Quantum Electronics · 2001 · 683 citations