Multiple photoionisation of Xe atoms between 4.1 and 8.0 keV: mean charge of Xe ions

Abstract

The charge state distribution of Xe ions produced by 4.1-8.0 keV synchrotron radiation has been measured by means of a time-of-flight mass spectrometer. It is found that the mean charge of Xe ions resulting from atomic rearrangement following the creation of the inner-shell vacancies in Xe atoms significantly depends on the photon energy and is clearly affected by L-subshell ionisation thresholds. The experimental results are found to be in good agreement with the Monte Carlo calculations.