Publication | Closed Access
Reflection electron microscopy study of clean Si(111) surface reconstruction during the (7 × 7) ⇔ (1 × 1) phase transition
45
Citations
12
References
1991
Year
Materials ScienceSurface CharacterizationEngineeringCrystalline DefectsMicroscopySurface AnalysisSurface ScienceApplied PhysicsClean SiSurface Reconstruction
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