Japanese Journal of Applied Physics · 1997 · 54 citations · 16 references
EngineeringAfm TipResponsive PolymersNanostructured PolymerPolymer NanocompositesSoft MatterPolymersPolymer ProcessingRheologyVinyl Methyl EtherPolymer ChemistryBiophysicsMaterials SciencePolymer BlendPolymer BlendsPolymer ScienceScanning Force MicroscopyPolymer CharacterizationPolymer PropertyThin Films
We measured force–distance curves of polystyrene (PS)/poly (vinyl methyl ether) (PVME) blend thin films using atomic force microscopy (AFM) in order to pursue the possible usage of AFM as a tool for detecting viscoelastic properties of polymeric materials from a nanoscopic point of view. In quasi-static measurements of force–distance curves for a sample whose PS content equals 100%, both adhesive force and capillary force were measured separately. A phenomenon possibly assigned to pulling off of polymer chains by an AFM tip could also be observed for a sample whose PS content equals 60%. By changing the velocity of the AFM tip acting on a blend sample whose PS content equals 40%, we confirmed that the law of time–temperature reducibility holds even on such a nanoscopic scale. This blend sample behaved as a viscous fluid at room temperature, while its behavior became glassy when faster movements of the AFM tip were applied. A discussion on the future development of a new field of research which should be called “nanorheology" was also presented.
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G. Binnig, C. F. Quate, Ch. Gerber · Physical Review Letters · 1986 · 14.3K citations · Full text
Atomic-scale friction of a tungsten tip on a graphite surface
C. Mathew Mate, Gary M. McClelland, R. Erlandsson et al. · Physical Review Letters · 1987 · 1.7K citations