Applied Physics Letters · 2014 · 41 citations · 11 references
Natural SciencesElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesThin FilmsDielectric MaterialsDielectricsNanocompositesThin Film Electrical PropertiesThin-film MaterialsThin-film TransistorsAmorphous Indium Gallium Zinc OxideBias Stress EffectsFlexible DisplaysFlexible ElectronicsFlexible SubstratesFlexible Thin-film TransistorsNanocomposite MaterialsNanoparticles
In this study, the Al2O3 nanoparticles were incorporated into polymer as a nono-composite dielectric for used in a flexible amorphous Indium-Gallium-Zinc Oxide (a-IGZO) thin-film transistor (TFT) on a polyethylene naphthalate substrate by solution process. The process temperature was well below 100 °C. The a-IGZO TFT exhibit a mobility of 5.13 cm2/V s on the flexible substrate. After bending at a radius of 4 mm (strain = 1.56%) for more than 100 times, the performance of this a-IGZO TFT was nearly unchanged. In addition, the electrical characteristics are less altered after positive gate bias stress at 10 V for 1500 s. Thus, this technology is suitable for use in flexible displays.
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Jin‐Seong Park, Tae-Woong Kim, Denis Stryakhilev et al. · Applied Physics Letters · 2009 · 475 citations