Structural paradigm of Se-rich Ge–Se glasses by high-resolution x-ray photoelectron spectroscopy

Abstract

The structure of binary GexSe100−x chalcogenide glass family (0≤x≤30) is determined by high-resolution x-ray photoelectron spectroscopy (XPS). On the basis of compositional dependences of fitting parameters for Ge and Se core level XPS spectra, the ratio between edge- and corner-shared tetrahedra is determined. We find that this ratio for glasses with 20≤x≤30 is almost constant with a value same as for the high-temperature crystalline form of GeSe2.