Analysis of self-heating related instability in n-channel polysilicon thin film transistors fabricated on polyimide - Concepedia

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Analysis of self-heating related instability in n-channel polysilicon thin film transistors fabricated on polyimide

26

Citations

13

References

2009

Year

Luca Maiolo, Massimo Cuscunà, L. Mariucci, A. Minotti, A. Pecora, D. Simeone, A. Valletta, G. Fortunato

Thin Solid Films

Electrical EngineeringEngineeringBias Temperature InstabilityApplied PhysicsSemiconductor Device FabricationSilicon On InsulatorSelf-heating Related Instability

References

	Year	Citations

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