Errors in retarding potential analyzers caused by nonuniformity of the grid-plane potential

Abstract

One aspect of the degradation in performance of retarding potential analyzers caused by potential depressions in the retarding grid is quantitatively estimated from laboratory measurements and theoretical calculations. A simple expression is obtained that permits the use of laboratory measurements of grid properties to make first-order corrections to flight data. Systematic positive errors in ion temperature of approximately 16% for the Ogo 4 instrument and 3% for the Ogo 6 instrument are deduced. The effects of the transverse electric fields arising from the grid potential depressions are not treated.