Applied Physics Letters · 2009 · 22 citations · 13 references
Natural SciencesMaterials ScienceCondensed Matter PhysicsNanomaterialsNanotechnologyElectron MicroscopyNanomaterial CharacterizationNanoparticle CharacterizationNanoparticle InterfacesNanoscale MaterialsTransmission Electron MicroscopyHigh-resolution Electron MicroscopyHigh-resolution ImagingHigh-resolution Transmission Electron MicroscopyNanoparticlesNanoscale Materials CharacterizationPhase RetrievalSizeSize Effects
We report on a method to measure the mean inner potential (V0) using transmission electron microscopy. It is based on phase retrieval from a focus series and has allowed to measure V0 as a function of the size for a system of gold nanoparticles. It comes out that V0 increases for particles below 2 nm. The focus series being carried out in conditions close to the high-resolution ones, structural information can be directly obtained. The high-resolution images have revealed that significant structural change occurs below the 2 nm size, which should be related to the V0 increase.
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Jesús M. de la Fuente, África G. Barrientos, T.C. Rojas et al. · PubMed · 2001 · 358 citations
Twenty forms of electron holography
J. M. Cowley · Ultramicroscopy · 1992 · 175 citations