Journal of Applied Physics · 1992 · 34 citations · 11 references
Natural SciencesMaterials SciencePhysicsElectronic MaterialsSemiconductor MaterialsThin FilmsEpitaxial GrowthSemiconductor Crystal GrowthSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor PhysicsSemiconductor Thin FilmsCrystal PerfectionEpitaxial Film GrowthEpitaxial Thin FilmsEpitaxial Thin-film GrowthPhotoluminescenceSubstrate Temperature EffectsTwo-dimensional Electron GasesX-ray Diffraction Analysis
The growth of high quality CdTe epitaxial films on p-InSb(111) by a simple method of temperature gradient vapor transport deposition was carried out to investigate the possibility of the existence of a two-dimensional electron gas with high mobility at CdTe/InSb heterointerfaces. From the x-ray diffraction analysis, the grown layer was found to be a CdTe epitaxial film. Photoluminescence measurements at 15 K showed that a CdTe film grown on InSb(111) in the temperature range between 180 and 280 °C appeared to have an optimum crystal perfection at a substrate temperature of about 245 °C. These results also indicated that the CdTe films grown above 245 °C contained a significant problem due to interdiffusion from the InSb substrates during the growth.
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Thomas Theis, P. M. Mooney, S. L. Wright · Physical Review Letters · 1988 · 179 citations
Natural Sciences, Materials Science, Condensed Matter Physics +16
Spatial localization of impurities in δ-doped GaAs
E. F. Schubert, J. B. Stark, B. Ullrich et al. · Applied Physics Letters · 1988 · 111 citations
Chemical and electronic structure of InSb-CdTe interfaces
K. J. Mackey, P. M. G. Allen, W G Herrenden-Harker et al. · Applied Physics Letters · 1986 · 64 citations