Publication | Closed Access
The worst ill-conditioned silicon wafer slicing machine detected by using grey relational analysis
64
Citations
17
References
2006
Year
Physical Design (Electronics)Wafer Scale ProcessingEngineeringAdvanced Packaging (Semiconductors)Electronic Design AutomationIndustrial EngineeringComputer EngineeringComputer ArchitectureComputer ScienceElectronic PackagingMicroelectronicsGrey Relational AnalysisSilicon Debugging
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