Publication | Closed Access
Three-Dimensional Subwavelength Imaging by a Photonic-Crystal Flat Lens Using Negative Refraction at Microwave Frequencies
116
Citations
17
References
2005
Year
EngineeringNano-opticsMicroscopyWave OpticNegative-index MetamaterialPinhole SourceElectromagnetic MetamaterialsPinhole SourcesOptical PropertiesThree-dimensional Subwavelength ImagingNanophotonicsPhotonicsLight Field ImagingPhysicsClassical OpticsSuper-resolutionComputational Optical ImagingMicrowave PhotonicsOptical ImagingMicrowave FrequenciesSubwavelength Pinhole SourceApplied PhysicsDiffractive Optic
We experimentally demonstrate subwavelength resolution imaging at microwave frequencies by a three-dimensional (3D) photonic-crystal flat lens using full 3D negative refraction. The photonic crystal was fabricated in a layer-by-layer process. A subwavelength pinhole source and a dipole detector were employed for the measurement. By point-by-point scanning, we obtained the image of the pinhole source shown in both amplitude and phase, which demonstrated the imaging mechanism and subwavelength feature size in all three dimensions. An image of two pinhole sources with subwavelength spacing showed two resolved spots, which further verified subwavelength resolution.
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