Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1988 · 20 citations · 0 references
Natural SciencesMaterials EngineeringMaterials ScienceComputational Materials ScienceSurface ScienceThin FilmsMicrostructure AnalysisSurface MorphologySurface RoughnessThin Film NucleationThin Film Surface MorphologyThin-film MaterialsComputer Simulation FrameworksCross-sectional MorphologyFilm MorphologyFilm ThicknessRoughness EvolutionSurface Morphology EvolutionThin Film Surface RoughnessThin-film Morphology
Two macroscopic two-dimensional geometrical models have been developed to describe the cross-sectional morphology of thin films which exhibit columnar microstructure. Using simple geometrical assumptions and assumptions based on experimental results, these models trace the evolution of cone-like clusters from their point of nucleation within the film to their emergence at the top surface. The simulated films are then characterized by calculating their roughness as a function of film thickness for different input parameters.