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Specific features of band structure in large-sized Si<sub>2 <i>x</i></sub>C<sub><i>x</i></sub>(1.04 <i>x</i>< 1.10) nanocrystallites
61
Citations
25
References
2003
Year
Materials ScienceSemiconductorsCarbon SheetEngineeringPhysicsNanomaterialsNanotechnologyCrystalline DefectsBand StructureApplied PhysicsCondensed Matter PhysicsSemiconductor MaterialThin FilmsSharp-like Absorption ResonancesNanocrystalline MaterialSpecific FeaturesSemiconductor Nanostructures
The band structure of large-sized (20–35 nm) nanocrystallites (NCs) of Si2−xCx (1.04 < x < 1.10) has been investigated using different band energy approaches and a modified Car–Parinello molecular dynamics structure optimization of the NC interfaces. The excess of carbon favours the appearance of a thin prevailingly carbon-contained layer (with thickness of about 1 nm) covering the crystallites. As a consequence we observe a substantial structural reconstruction of near-the-interface SiC crystalline layers. Optical absorption spectra of the investigated sheets were performed. The numerical modelling shows that these NCs can be considered as SiC reconstructed crystalline films with a thickness of about 2 nm covering the SiC crystallites. The observed data are considered within different one-electron band structure methods. It was shown that the carbon sheet plays a key role in the modified band structure. The independent manifestation of the important role played by the reconstructed confined layers is due to the experimentally discovered excitonic-like resonances. Low-temperature absorption measurements confirm the existence of sharp-like absorption resonances originating from the reconstructed layers.
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