Publication | Closed Access
Extraction of optical constants of zinc oxide thin films by ellipsometry with various models
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Citations
26
References
2006
Year
Materials ScienceSurface CharacterizationIi-vi SemiconductorOptical MaterialsEngineeringOptical PropertiesOxide ElectronicsSurface ScienceApplied PhysicsVarious ModelsThin FilmsOptoelectronicsThin Film ProcessingOptical Constants
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