Publication | Closed Access
The application of high-resolution Rutherford backscattering techniques to near-surface analysis
98
Citations
19
References
1978
Year
RadarEngineeringElectron MicroscopyPhysicsMicroscopyNear-surface AnalysisSurface AnalysisApplied PhysicsMicroanalysisElectron DiffractionElectron MicroscopeComputational ElectromagneticsInstrumentationSynchrotron Radiation
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