Publication | Open Access
Spin-diffusion lengths in metals and alloys, and spin-flipping at metal/metal interfaces: an experimentalist’s critical review
596
Citations
107
References
2007
Year
Magnetoresistance in magnetic multilayers depends on electron spin, which flips over characteristic distances in metals and at interfaces, affecting transport properties. This review explains how to measure spin‑diffusion lengths in pure metals and alloys and the spin‑flipping probability at metallic interfaces. Spin‑diffusion lengths (lsfM) characterize spin decay in CPP and LNL geometries, while interface spin‑flipping is quantified by δM1/M2, and the review compiles measured values and discusses their determination limits. In simple cases, lsfN limits CPP‑MR and LNL‑MR decay with N‑layer thickness, lsfF governs CPP‑MR growth with F‑layer thickness, and larger δM1/M2 reduces MR.
In magnetoresistance (MR) studies of magnetic multilayers composed of combinations of ferromagnetic (F) and non-magnetic (N) metals, the magnetic moment (or related 'spin') of each conduction electron plays a crucial role, supplementary to that of its charge. While initial analyses of MR in such multilayers assumed that the direction of the spin of each electron stayed fixed as the electron transited the multilayer, we now know that this is true only in a certain limit. Generally, the spins 'flip' in a distance characteristic of the metal, its purity, and the temperature. They can also flip at F/N or N1/N2 interfaces. In this review we describe how to measure the lengths over which electron moments flip in pure metals and alloys, and the probability of spin-flipping at metallic interfaces. Spin-flipping within metals is described by a spin-diffusion length, lsfM, where the metal M = F or N. Spin-diffusion lengths are the characteristic lengths in the current-perpendicular-to-plane (CPP) and lateral non-local (LNL) geometries that we focus upon in this review. In certain simple cases, lsfN sets the distance over which the CPP-MR and LNL-MR decrease as the N-layer thickness (CPP-MR) or N-film length (LNL) increases, and lsfF does the same for increase of the CPP-MR with increasing F-layer thickness. Spin-flipping at M1/M2 interfaces can be described by a parameter, δM1/M2, which determines the spin-flipping probability, P = 1−exp(−δ). Increasing δM1/M2 usually decreases the MR. We list measured values of these parameters and discuss the limitations on their determinations.
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