Electron impact ionization in a microion trap mass spectrometer

Oleg Kornienko, Peter T. A. Reilly, William B. Whitten, J. Michael Ramsey

Review of Scientific Instruments · 1999 · 45 citations · 5 references

Concepts

Abstract

A microscale ion trap mass spectrometer (r0=0.50 mm, z0=0.55 mm) with an electron gun for electron impact ionization of gaseous samples is described. Operated in the mass-instability mode, the trap had a m/z range from 40 to 400 Da. For single scans, peak widths of less than 0.2 Da were obtained.

References

5