X7R Multilayer Ceramic Capacitors with Nickel Electrodes

Abstract

Electrical properties and microstructures of a holmium-doped (Ba 1.01 Mg 0.01 )O 1.02 (Ti 0.98 Zr 0.02 )O 2 system were studied. Additions of Ho 2 O 3 had little effect in preventing the dielectrics from reducing at high temperature, but the resistivity at low temperature increased with increasing amount of Ho 2 O 3 when treated in oxidizing atmosphere at the cooling stage. From transmission electron micrograph (TEM) observation, it was noted that the microstructure exhibited a grain core-grain shell structure. Newly developed X7R multilayer ceramic capacitors with Ni electrodes revealed highly reliable electrical properties.