Statistical approach for contact angle determination on inclining surfaces: “slow-moving” analyses of non-axisymmetric drops on a flat silanized silicon wafer - Concepedia

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Statistical approach for contact angle determination on inclining surfaces: “slow-moving” analyses of non-axisymmetric drops on a flat silanized silicon wafer

22

Citations

39

References

2014

Year

Michael Schmitt, Rolf Hempelmann, Sven Ingebrandt, Walid M. Munief, Dan Durneata, Katja Groβ, Florian Heib

International Journal of Adhesion and Adhesives

EngineeringMechanicsContact MechanicSurface ScienceApplied PhysicsMechanical EngineeringSilicon WaferStatistical ApproachSurface EngineeringContact Angle Determination

References

	Year	Citations

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