Dielectric properties of Ln(Mg<sub>1/2</sub>Ti<sub>1/2</sub>)O<sub>3</sub> as substrates for high-T<sub><i>c</i></sub> superconductor thin films - Concepedia

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Dielectric properties of Ln(Mg<sub>1/2</sub>Ti<sub>1/2</sub>)O<sub>3</sub> as substrates for high-T<sub><i>c</i></sub> superconductor thin films

122

Citations

15

References

1999

Year

Seo-Yong Cho, Chang-Hun Kim, Dong‐Wan Kim, Kug Sun Hong, Jong‐Hee Kim

Journal of materials research/Pratt's guide to venture capital sources

Materials ScienceDielectric PropertiesSuperconducting MaterialHigh-tc SuperconductivityEngineeringApplied PhysicsCondensed Matter PhysicsSuperconductivityThin Film Process TechnologyThin FilmsThin Film Processing

References

	Year	Citations

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