Field-ion microscopy of silicon

Surface States and Rectification at a Metal Semi-Conductor Contact

John Bardeen · Physical Review · 1947 · 2.1K citations

Natural Sciences, Materials Science, Electrochemistry +16

Field Ion Microscopy, Principles and Applications

Peter H. Bartels, Erwin W. Müller, Tien T. Tsong · Transactions of the American Microscopical Society · 1970 · 617 citations

Natural Sciences, Physics, Optics +5

Surface Properties of Germanium

W. H. Brattain, John Bardeen · Bell System Technical Journal · 1953 · 590 citations

Natural Sciences, Chemistry, Materials Science +9

Field Emission from Silicon

L.A. D'Asaro · Journal of Applied Physics · 1958 · 25 citations

Engineering, Materials Science, Physics +14