The Thermal Expansion of GeS and GeTe

Abstract

Abstract The thermal expansion of GeS has been studied above room temperature up to the melting point of 658 ± 5°C by X‐ray diffraction techniques using a 190 mm diameter Unicam high temperature camera. The thermal expansion of the crystallographic axes is linear with distinct changes in the rate of expansion at about 250°C, 370°C and 510°C. No first‐order structural transformation was observed for this system up to the melting point. The results of additional studies on GeTe are in general agreement with those of others and confirm trends in the thermal expansion behavior of the germanium monochalcogenide series.