Biassed secondary electron imaging in a UHV-STEM - Concepedia

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Biassed secondary electron imaging in a UHV-STEM

68

Citations

9

References

1989

Year

G. G. Hembree, Peter A. Crozier, Jeff Drucker, Mohan Krishnamurthy, J. A. Venables, J. M. Cowley

Ultramicroscopy

Electron MicroscopyPhysicsMedical ImagingMicroscopyBiomedical ImagingElectron MicroscopeSecondary Electron ImagingElectron Optic

References

	Year	Citations

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