Concepedia

Biassed secondary electron imaging in a UHV-STEM

G. G. Hembree, Peter A. Crozier, Jeff Drucker, Mohan Krishnamurthy, J. A. Venables, J. M. Cowley

Ultramicroscopy · 1989 · 68 citations · 9 references

DOI

Concepts

References

9

Electronmicroscopy and Analysis-1981

Solar Energy · 1984 · 817 citations

Reflection electron microscopy

K. Yagi · Journal of Applied Crystallography · 1987 · 119 citations

, , +14

Electron microscopy and analysis

Dennis Lacy · Micron (1969) · 1975 · 118 citations

, , +12

Reflection electron energy loss spectroscopy (reels): A technique for the study of surfaces

Zhong Lin Wang, J. M. Cowley · Surface Science · 1988 · 83 citations

, , +11

Visualization of submonolayers and surface topography by biassed secondary electron imaging: Application to Ag layers on Si and W surfaces

Masaaki Futamoto, M. Hanbücken, C. J. Harland et al. · Surface Science · 1985 · 72 citations

, , +16