Electronics Letters · 1991 · 71 citations · 4 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsPhotonicsSemiconductor DevicesHigh-frequency Semiconductor DevicesIntegrated PhotonicsPhotodetectorsPhotonic Integrated CircuitsSemiconductor DetectorsWide Band Gap SemiconductorsDetector Quantum EfficiencyExternal Quantum EfficiencyIntegrated PhotodetectorsMetalorganic Vapor Phase EpitaxyPhotodetectionPhotodetector MaterialsPhotodiodesQuantum Efficiency
There is an inherent tradeoff between the quantum efficiency and bandwidth of conventional pin photodiodes. In the case of devices based on III-V semiconductors, an absorption region thickness of approximately 2 μm is required to achieve quantum efficiencies greater than 80%, although this limits the transit-time-limited bandwidth to less than 15 GHz. It has recently been shown that a microcavity photodiode can circumvent this performance tradeoff and achieve both high quantum efficiency and large bandwidths. The fabrication of a microcavity pin photodiode with a high quantum efficiency near 1.55 μm is described. An external quantum efficiency of 82% at 1480 nm has been achieved with an InGaAs absorption layer only 2000 Å thick embedded in a resonant cavity grown by metal organic vapour phase epitaxy (MOVPE).
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50 GHz InGaAs edge-coupled <i>pin</i> photodetector
D. Wake, Thomas Spooner, S.D. Perrin et al. · Electronics Letters · 1991 · 60 citations