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Effects of buffer layers on the orientation and dielectric properties of Ba(Zr0.20Ti0.80)O3 thin films prepared by sol–gel method

Materials ScienceDielectric PropertiesThin Film PhysicsMaterial AnalysisEngineeringOxide ElectronicsSurface ScienceApplied PhysicsBuffer LayersThin Film Process TechnologyThin FilmsO3 Thin FilmsThin Film Processing