Publication | Closed Access
Transient interferometric technique for measuring thermal expansion at high temperatures: Thermal expansion of tantalum in the range 1500?3200 K
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Citations
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References
1982
Year
EngineeringMeasurementEducationGeophysicsCalibrationThermal AnalysisThermophysicsThermodynamicsInstrumentationPhysicsTransient Interferometric TechniqueThermal PhysicsHigh TemperaturesHeat TransferTemperature MeasurementApplied PhysicsThermal SensorThermal EngineeringThermal Expansion
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