British Journal of Applied Physics · 1957 · 27 citations · 1 references
Natural SciencesChemistryMaterials ScienceMaterials CharacterizationSurface ScienceThin FilmsThin Film Optical PropertiesThin-film MaterialsDensityDensity MeasurementsFilm ThicknessFilm Thickness MeasurementOptical Density MeasurementOptical Thin Film CharacterizationThickness-dependent Optical PropertiesThin-film Optical Characterization
A nearly linear relationship has been found to exist between the optical density and the thickness of evaporated carbon films. The determination of film thickness by density measurements is shown to have a number of advantages over measurement by interferometry, particularly for very thin films.
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