Thickness and optical constants measurement of thin film growth with circular heterodyne interferometry

Control of preferred orientation for ZnO films: control of self-texture

Norifumi Fujimura, Tokihiro Nishihara, Seiki Goto et al. · Journal of Crystal Growth · 1993 · 682 citations

Natural Sciences, Materials Engineering, Materials Science +10

Complex refractive-index measurement based on Fresnel’s equations and the uses of heterodyne interferometry

Ming-Horng Chiu, Ju-Yi Lee, Der-Chin Su · Applied Optics · 1999 · 94 citations

Natural Sciences, Materials Science, Physics +17

In situ monitoring of sputtered zinc oxide films for piezoelectric transducers

N.K. Zayer, R. Greef, Keith D. Rogers et al. · Thin Solid Films · 1999 · 73 citations

Engineering, Materials Engineering, Materials Science +16

Method for determining the optical axis and (n_e, n_o) of a birefringent crystal

Der‐Chin Su, Cheng-Chih Hsu · Applied Optics · 2002 · 27 citations

Natural Sciences, Physics, Optical Materials +9

Ellipsometry for III–V epitaxial growth diagnostics

G.N. Maracas, C. H. Kuo, S. Anand et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1995 · 21 citations

Natural Sciences, Materials Engineering, Materials Science +17