Thermoelectric transport and Hall measurements of low defect Sb₂Te₃thin films grown by atomic layer deposition

Abstract

This is the Accepted Manuscript version of an article accepted for publication in <em>Semiconductor Science and Technology 2013, <strong>28</strong> 035010</em>. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it.&#xa0; The Version of Record is available online at <a href="https://doi.org/10.1088/0268-1242/28/3/035010">https://doi.org/10.1088/0268-1242/28/3/035010</a>. Published 4 February 2013