Combination of EBSP measurements and SIMS to study crystallographic orientation dependence of diffusivities in a polycrystalline material: oxygen tracer diffusion in La2 − xSrxCuO4 ± δ - Concepedia

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Combination of EBSP measurements and SIMS to study crystallographic orientation dependence of diffusivities in a polycrystalline material: oxygen tracer diffusion in La2 − xSrxCuO4 ± δ

26

Citations

14

References

1996

Year

J. Claus, Günter Borchardt, Sylvain Weber, Jean‐Marie Hiver, S. Scherrer

Materials Science and Engineering B

X-ray CrystallographyMaterials SciencePolycrystalline MaterialCrystal StructureOxygen Tracer DiffusionEngineeringCrystalline DefectsX-ray DiffractionCondensed Matter PhysicsApplied PhysicsCrystallographyEbsp Measurements

References

	Year	Citations

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