Applied Physics Letters · 2012 · 49 citations · 16 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSensorsChemical Vapor DepositionEnvironmental SensingHumidity SensorsMetal-oxide-semiconductor Field-effect TransistorsRelative HumiditySemiconductor Device MaterialsHumidityHumidity SensingLow-pressure Chemical Vapor DepositionMetal-semiconductor Field-effect TransistorsRelative Humidity MeasurementSiliconSilicon DioxideSurface Conductance
This letter presents a metal-oxide-semiconductor field effect transistor based humidity sensor which does not use any specific materials to sense the relative humidity. We simply make use of the low pressure chemical vapor deposited (LPCVD) silicon dioxide’s surface conductance change. When the gate is biased and then floated, the electrical charge in the gate is dissipated through the LPCVD silicon dioxide’s surface to the surrounding ground with a time constant depending on the surface conductance which, in turn, varies with humidity. With this method, extremely high sensitivity was achieved—the charge dissipation speed increased thousand times as the relative humidity increased.
16
CMOS scaling into the nanometer regime
Yuan Taur, D. A. Buchanan, Wei Chen et al. · Proceedings of the IEEE · 1997 · 889 citations
Engineering, Computer Engineering, Electrical Engineering +17
Humidity sensors based on pentacene thin-film transistors
Zhengtao Zhu, Jeffrey T. Mason, Rüdiger Dieckmann et al. · Applied Physics Letters · 2002 · 364 citations
Future CMOS scaling and reliability
C. Hu · Proceedings of the IEEE · 1993 · 208 citations
Engineering, Computer Engineering, Electrical Engineering +17