Publication | Closed Access
A study of carrier lifetime in silicon by laser-induced absorption: A perpendicular geometry measurement
31
Citations
25
References
1992
Year
PhotonicsEngineeringPhysicsLaser-induced BreakdownApplied PhysicsLaser-induced AbsorptionSemiconductor Device FabricationCarrier LifetimePulsed Laser DepositionOptoelectronicsSilicon On InsulatorPerpendicular Geometry Measurement
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