Impurities in semiconductive compounds used as HV cable shields

Abstract

Quantitative PIXE (proton-induced X-ray emission) and neutron activation analysis measurements of the concentration and distribution of mineral impurities in three different semiconductive compounds used as HV (high voltage) cable shields have been made. These materials contain varying amounts of different carbon blacks. It is shown that the use of acetylene black significantly reduces the mineral impurity concentrations. From a practical point of view, this should result in better cable quality and thus a longer cable lifetime.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>