Quantum Electronic Stability of Atomically Uniform Films

Dah-An Luh, Timothy A. Miller, J. J. Paggel, M. Y. Chou, T.‐C. Chiang

Science · 2001 · 159 citations · 39 references

Concepts

Abstract

We have studied the structural stability of thin silver films with thicknesses of N = 1 to 15 monolayers, deposited on an Fe(100) substrate. Photoemission spectroscopy results show that films of N = 1, 2, and 5 monolayer thicknesses are structurally stable for temperatures above 800 kelvin, whereas films of other thicknesses are unstable and bifurcate into a film with N +/- 1 monolayer thicknesses at temperatures around 400 kelvin. The results are in agreement with theoretical predictions that consider the electronic energy of the quantum well associated with a particular film thickness as a significant contribution to the film stability.

References

39