Publication | Open Access
P-type and N-type multi-gate polycrystalline silicon vertical thin film transistors based on low-temperature technology
16
Citations
13
References
2013
Year
Electrical EngineeringEngineeringBias Temperature InstabilityApplied PhysicsLow-temperature TechnologySemiconductor Device FabricationSilicon On InsulatorSemiconductor Device
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