Projectile-charge-state dependence of target<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>L</mml:mi></mml:math>-shell ionization by 1.86-MeV/amu fluorine and silicon ions and 1.8-MeV/amu chlorine ions

Abstract

$L\ensuremath{\alpha}$ x-ray-production cross sections have been measured for solid targets of $_{60}\mathrm{Nd}$, $_{67}\mathrm{Ho}$, and $_{79}\mathrm{Au}$ for 1.86-MeV/amu $_{9}^{19}\mathrm{F}$ and $_{14}^{28}\mathrm{Si}$, and 1.8-MeV/amu $_{17}^{35}\mathrm{Cl}$ ions as a function of the incident charge state. From the projectile-charge-state dependence of the cross sections, both direct-ionization and electron-capture contributions were extracted for a comparison to Coulomb ionization theories. The data provide supporting evidence for the theory of electron capture with a reduced binding effect. With standard fluorescence and Coster-Kronig yields uncorrected for multiple-ionization effects, the direct ionization theories did not simultaneously reproduce the projectile-${Z}_{1}$ and target-${Z}_{2}$ dependences of the data.