Publication | Closed Access
A novel method for thickness profile control in RF PECVD deposition on large area substrates
11
Citations
8
References
2005
Year
Electrical EngineeringEngineeringApplied PhysicsThickness Profile ControlElectronic PackagingChemical DepositionMicroelectronicsLarge Area SubstratesChemical Vapor DepositionRf Pecvd DepositionThin Film ProcessingElectromagnetic CompatibilityDepth-graded Multilayer Coating
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